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1. The defect concentration in this material is very low, which makes it suitable for use inelectronics.
这种材料的缺陷浓度非常低,因此适用于电子领域。
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2. The defect concentration in the crystal was measured using a scanning electron microscope.
使用扫描电子显微镜测量了晶体的缺陷浓度。
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3. The defect concentration in the sample was determined by analyzing the X-ray diffraction patterns.
通过分析X射线衍射图谱来确定样品中的缺陷浓度。