ellipsometry

[ˌelipˈsɔmitri]

n.

  1. 椭圆光度法;椭圆偏光法;椭圆对称法

网络词典

ellipsometry

英 ˈɛlɪpsəʊmrɪ 美 ˈɛlɪpsəʊmrɪ
名词 中文翻译:椭偏法
同义词: ['ellipsometrics', 'ellipsometry']

例句:

  1. 1. In ellipsometry, the sample is illuminated with a beam of light and its reflection is measured to determineits refractive index.
    在椭偏法中,样品被一束光线照亮,其反射被测量以确定其折射率。
  2. 2. The ellipsometry technique has been used to measure the thickness of thin films.
    椭偏技术已被用来测量薄膜的厚度。
  3. 3. The ellipsometry instrument can be used to analyze the optical properties of materials.
    椭偏仪器可以用来分析材料光学属性。