two-beam interference microscopy

  1. 双光束干涉显微术

网络词典

two-beam interference microscopy

英 ˈtwaɪbər ɪˈstrʌmɪsaɪləri 美 ˈtwaɪbər ɪˈstrumɪsəri
名词中文翻译1 中文翻译:Unknown
同义词: ['双光束干涉显微术,双光束干涉显微法,双光束干涉显微技术例句:1. The two-beam interference microscope is used to observe the surface structure of materials in a high resolution.(双光束干涉显微镜用于以高分辨率观察材料的表面结构。)']

例句:

  1. 1. The two-beam interference microscope is used to observe the surface structure of materials in a high resolution.
    双光束干涉显微镜用于以高分辨率观察材料的表面结构。
  2. 2. In this study, we used the two-beam interference microscope to analyze the microstructure ofthe material.
    在这项研究中,我们使用双光束干涉显微镜分析材料的微观结构。
  3. 3. The two-beam interference microscope has been widely used in the fields of material science and engineering for its high precision and accuracy.
    双光束干涉显微镜在材料科学和工程领域得到了广泛应用,因其高精度和高准确度。