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1. The wave-front shearing interferometer was used to measurethe surface roughness of the material.
波前剪切干涉仪被用来测量材料的表面粗糙度。
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2. The wave-front shearing interferometer was used to detectthe presence of defects in the material.
波前剪切干涉仪被用来检测材料中缺陷的存在。
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3. The wave-front shearing interferometer was used to measurethe thickness of the material.
波前剪切干涉仪被用来测量材料厚度。